Images are for reference only
SN74ABT8543DW
+BOMIC SCAN TEST DEV/TXRX 28-SOIC
-
ManufacturerTexas Instruments
-
Mfr. Part #SN74ABT8543DW
-
Datasheet SN74ABT8543DW DataSheet
-
Package SOIC-28
-
In Stock2932
365 Days Quality Guarantee
7*24 hours service quarantee
90-day after-sales guarantee
Genuine Product Guarantee
Specifications
| Attribute | Value |
| Supplier | Rochester Electronics, LLC,Texas Instruments |
| Package / Case | Bulk,Tube |
| Series | 74ABT |
| Part Status | Active |
| Logic Type | Scan Test Device with Registered Bus Transceiver |
| Voltage - Supply | 4.5V ~ 5.5V |
| Number of Bits | 8 |
| Operating Temperature | -40°C ~ 85°C |
| Mounting Type | Surface Mount |