SN74ABTH18646APM

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SN74ABTH18646APM

+BOM

IC SCAN-TEST-DEV/TXRX 64-LQFP

  • ManufacturerTexas Instruments

  • Mfr. Part #SN74ABTH18646APM

  • Package LQFP-64

  • In Stock9891

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Specifications

Attribute Value
Supplier Texas Instruments
Package / Case Tray
Series 74ABTH
Part Status Active
Logic Type Scan Test Device With Transceivers And Registers
Voltage - Supply 4.5V ~ 5.5V
Number of Bits 18
Operating Temperature -40°C ~ 85°C
Mounting Type Surface Mount

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