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SN74BCT8240ADWR
+BOMIC SCAN TEST DEVICE BUFF 24-SOIC
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ManufacturerTexas Instruments
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Mfr. Part #SN74BCT8240ADWR
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Datasheet SN74BCT8240ADWR DataSheet
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Package SOIC-24
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In Stock3855
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Specifications
| Attribute | Value |
| Supplier | Texas Instruments,Rochester Electronics, LLC |
| Package / Case | Tape & Reel (TR),Bulk |
| Series | 74BCT |
| Part Status | Obsolete |
| Logic Type | Scan Test Device with Inverting Buffers |
| Voltage - Supply | 4.5V ~ 5.5V |
| Number of Bits | 8 |
| Operating Temperature | 0°C ~ 70°C |
| Mounting Type | Surface Mount |