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SN74BCT8374ADWR

Name: SN74BCT8374ADWR
Rating: 4.8 (15 reviews)

+BOM

IC SCAN TEST DEVICE W/FF 24-SOIC

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Specifications

Attribute	Value
Supplier	Texas Instruments
Package / Case	Tape & Reel (TR)
Series	74BCT
Part Status	Obsolete
Logic Type	Scan Test Device with D-Type Edge-Triggered Flip-Flops
Voltage - Supply	4.5V ~ 5.5V
Number of Bits	8
Operating Temperature	0°C ~ 70°C
Mounting Type	Surface Mount

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